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Image Analysis & Stage Micrometers

Image Analysis & Stage Micrometers Test Targets are used to evaluate or calibrate an image system's performance by measuring image quality standards such as resolution, contrast, or depth of field. Image Analysis & Stage Micrometers Test Targets detail a range of shapes or patterns that measure the accuracy of an imaging system by viewing them with an imaging lens. Image Analysis & Stage Micrometers Test Targets effectively determine the capabilities of an imaging system, allowing for accurate certification of performance as well as for establishing baseline standards for multiple systems working together.

DOF 5-15 Depth of Field Target DOF 5-15 Depth of Field Target
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  • Test Depth of Field of Your Imaging System
  • Effective Measurement Eliminates the Need for Calculations
Dot and Square Calibration Target Dot and Square Calibration Target
  • Designed for Measurement Calibration
  • Positive or Negative Chrome Patterns on Glass
  • High Contrast Target for Imaging with Elements from 0.5 to 10mm
  • NIST Traceability Certificate Included
Dual Axis Linear Scale Stage Micrometer Dual Axis Linear Scale Stage Micrometer
  • Dual Axis Design
  • English and Metric Scales
  • NIST Certified Version Available
EO Machine Vision Stage Micrometers EO Machine Vision Stage Micrometers
  • NIST Traceable Certificate of Accuracy Included
  • Ideal for Quick Calibration of Vision Systems
  • Durable Storage Case Included
EO Telecentricity Target EO Telecentricity Target
  • Critical Tool for Measurement Vision Systems
  • Calibrates Any Type of Lens
  • Covers Large Range of Magnifications
Image Analysis Micrometers Image Analysis Micrometers
  • Designed for Morphological Calibration and Measurement
  • 8 Test Plates of Various Patterns
  • NIST Certified Version Available
Kodak Imaging Chart Kodak Imaging Chart
  • Over 18 Test Patterns
  • 8 ½" x 11" Film
Micro Line and Dot Standard Stage Micrometer Micro Line and Dot Standard Stage Micrometer
  • New Opal Version Available
  • Calibrate Pixel Dithering
  • Lines and Dot Range from 2μm to 100μm
Multi-Function Calibration Target for Low Magnification Systems Multi-Function Calibration Target for Low Magnification Systems
  • Calibrates Systems from 0.08X to 4X
  • Measures MTF, DOF, Resolution, FOV, and Distortion
  • NIST Certificate of Accuracy Included
Multi-Function High Magnification Calibration Targets Multi-Function High Magnification Calibration Targets
  • Designed for Measurement Calibration; Ideal for Microscopes and Machine Vision Systems
  • Includes Ronchi Rulings, Concentric Circles, Square Grids, and a Linear Microscale
  • Two Targets Available for Different Magnifications
  • NIST Certificate of Accuracy Included
Multi-Grid Standard Stage Micrometer Multi-Grid Standard Stage Micrometer
  • Calibrate Distortion in High Magnification Systems
White Ivory Glass Reticle Targets White Ivory Glass Reticle Targets
  • Crossline, Index Grid, or Concenctric Circle Reticles
  • White Ivory Soda Lime Glass Substrates
  • 27mm Diameter Reticles
Positioning Stages with Digital Micrometers Positioning Stages with Digital Micrometers
  • 0.001mm Resolution Directly Readable Micrometer
  • Readout in Inches or Millimeters
  • Available with English or Metric Mounting Holes
Reticle Calibration Stage Micrometer Reticle Calibration Stage Micrometer
  • Features a Series of "H" Shaped Fiducial Images
  • Image Sizes from 0.1 to 20mm
  • Available with NIST Traceable Data
Stage Micrometers Stage Micrometers
  • Reticle Scales Centered on Microscope Slides
  • Designed for Routine Calibration
  • 1 x 3" Slide Sizes
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